Part detail
Semiconductor Device Diode
01037-1N23WGMRNSN5961-00-866-3158CAGE037Z3
Semiconductor Device Diode
Detailed description
01037-1N23WGMR procurement notes
Semiconductor Device Diode
Specifications
Reference data
Multi-line procurement
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Compliance
- AS9120:2025· Aerospace QMS
- ISO 9001:2015· Quality Management
- FAA AC 00-56B· Voluntary Industry Distributor Accreditation
- U.S. ONLY· Fulfillment
NSN Information for Part Number 01037-1N23WGMR with NSN 5961-00-866-3158, 5961008663158
Characteristics Data of NSN 5961-00-866-3158, 5961008663158
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | GLASS AND METAL |
| ABJT | TERMINAL LENGTH | 0.180 INCHES MINIMUM AND 0.190 INCHES MAXIMUM |
| ADAV | OVERALL DIAMETER | 0.246 INCHES MINIMUM AND 0.250 INCHES MAXIMUM |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTRD | POWER RATING PER CHARACTERISTIC | 20.0 WATTS SMALL-SIGNAL INPUT POWER, COMMON-COLLECTOR PRESET |
| PRMT | PRECIOUS MATERIAL | GOLD |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 PIN |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/322 GOVERNMENT SPECIFICATION |
| ABHP | OVERALL LENGTH | 0.324 INCHES MINIMUM AND 0.410 INCHES MAXIMUM |
| AXGY | MOUNTING METHOD | TERMINAL |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS AMBIENT AIR |
| PMLC | PRECIOUS MATERIAL AND LOCATION | BODY SURFACE GOLD |
| TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI |