Part detail
End Item Identification: Common test equipment Test Type for Which Designed: Parameter charactization of semiconductor devices Inclosure Feature: Multiple item W/housing
370-1PNSN6625-01-419-8132CAGE1T110
End Item Identification: Common test equipment Test Type for Which Designed: Parameter charactization of semiconductor devices Inclosure Feature: Multiple item W/housing
Detailed description
370-1P procurement notes
End Item Identification: Common test equipment Test Type for Which Designed: Parameter charactization of semiconductor devices Inclosure Feature: Multiple item W/housing
Specifications
Reference data
Multi-line procurement
Sourcing more than one part?
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Compliance
- AS9120:2025· Aerospace QMS
- ISO 9001:2015· Quality Management
- FAA AC 00-56B· Voluntary Industry Distributor Accreditation
- U.S. ONLY· Fulfillment
Characteristics Data of NSN 6625-01-419-8132, 6625014198132
| MRC | Criteria | Characteristic |
|---|---|---|
| AQXY | TEST TYPE FOR WHICH DESIGNED | PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES |
| SR-5 | MANUFACTURERS CODE | 1T110 |
| ZZZP | III PURCHASE DESCRIPTION IDENTIFICATION | 1T110CONTRACT/F41608-94-C-0785 |
| SR-5 | THE MANUFACTURERS DATA | |
| ANPZ | INCLOSURE FEATURE | MULTIPLE ITEM W/HOUSING |
| AGAV | III END ITEM IDENTIFICATION | COMMON TEST EQUIPMENT |
| SR-5 | DESIGN CONTROL REFERENCE | 370A-1P |