The NSN 5962-01-147-3387 part numbers such as 12306839, 12306839 manufactured by Bae Systems Technology Solutions And Services Inc, Bae Systems Technology Solutions And Services Inc Dba Vitro Services are available in RFQ Experts’ inventory. An ASAP Semiconductor owned and operated website, RFQ Experts has over six billion parts in its inventory for NSN 5962-01-147-3387. ASAP is committed to streamlining the parts procurement process for our customers, making it easy for them to search through billions of parts to find exactly what they are looking for. We have dedicated account managers ready to solve procurement issues our clients face, whether it’s a need for obsolete parts, or an aircraft on ground situation. As an AS9120B, ISO 9001:2015, and FAA AC 0056B certified company, each and every part that we ship goes through numerous quality checks and inspections, to ensure that we sell only the highest-quality parts.
Alternative NSN: 5962-01-147-3387 |
Item Name: Microcircuit Memory |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 011473387 |
NCB Code: USA (01) |
Manufacturers: Bae Systems Technology Solutions And Services Inc, Bae Systems Technology Solutions And Services Inc Dba Vitro Services |
Part No | NSN | Item Name | QTY | RFQ |
---|---|---|---|---|
12306839 | 5962-01-147-3387 | microcircuit memory | Avl | RFQ |
12306839 | 5962-01-147-3387 | microcircuit memory | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.915 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.170 INCHES MAXIMUM |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 8.0 VOLTS MAXIMUM TOTAL SUPPLY |
TTQY | TERMINAL TYPE AND QUANTITY | 18 PRINTED CIRCUIT |
ADAT | BODY WIDTH | 0.320 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | MONOLITHIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQZP | INPUT CIRCUIT PATTERN | 10 INPUT |
CZER | MEMORY DEVICE TYPE | RAM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
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